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Effect of twisting of the diffraction net planes on the integral intensities at Laue diffraction of X-rays in elastically bent silicon crystals
L. I. Datsenko, E. N. Kislovskii, V. I. Khrupa, K. M. Shevtsov-KazmirchukVolume:
78
Year:
1983
Language:
english
Pages:
1
DOI:
10.1002/pssa.2210780266
File:
PDF, 176 KB
english, 1983