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Stress Effects on the Switching Voltage of Metal-SnO2-Si(n)-Si(p+) Devices
H. K. Phan, L. H. Phu, C. V. ChiemVolume:
79
Year:
1983
Language:
english
Pages:
1
DOI:
10.1002/pssa.2210790145
File:
PDF, 167 KB
english, 1983