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The Capacitance and Characteristic Relaxation Times at Carrier Exclusion in Compensated Semiconductors with Deep Traps and Non-Injecting Contacts
D. A. Aronov, B. R. MamatkulovVolume:
81
Year:
1984
Language:
english
Pages:
1
DOI:
10.1002/pssa.2210810166
File:
PDF, 246 KB
english, 1984