Damage and Trapping Behaviour of Crystalline Silicon at Low...

Damage and Trapping Behaviour of Crystalline Silicon at Low Energy Deuterium Implantation

D. Hildebrandt, H. Strusny, R. Groetzschel, E. Kotai, F. Paszti
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Volume:
85
Year:
1984
Language:
english
Pages:
1
DOI:
10.1002/pssa.2210850146
File:
PDF, 200 KB
english, 1984
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