Determination of the Thickness and Refractive Index of Cu2O...

physica status solidi (a) 1986 Vol. 93; Iss. 2

Determination of the Thickness and Refractive Index of Cu2O Thin Film Using Thermal and Optical Interferometry

M. E. Abu-Zeid, A. E. Rakhshani, A. A. Al-Jassar, Y. A. Youssef
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Volume:
93
Year:
1986
Language:
english
Pages:
8
DOI:
10.1002/pssa.2210930226
File:
PDF, 466 KB
english, 1986
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