![](/img/cover-not-exists.png)
Cathodoluminescence measurements using the scanning electron microscope for the determination of semiconductor parameters
W. Hergert, P. Reck, L. Pasemann, J. SchreiberVolume:
101
Year:
1987
Language:
english
Pages:
8
DOI:
10.1002/pssa.2211010237
File:
PDF, 402 KB
english, 1987