X-Ray Diffraction in Interferometric Systems Consisting of...

physica status solidi (a) 1987 Vol. 104; Iss. 2

X-Ray Diffraction in Interferometric Systems Consisting of Crystalline Blocks of Different Thickness

P. A. Bezirganyan, L. G. Gasparyan, K. G. Truni, V. P. Mkrtchyan
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Volume:
104
Year:
1987
Language:
english
Pages:
19
DOI:
10.1002/pssa.2211040206
File:
PDF, 1.19 MB
english, 1987
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