![](/img/cover-not-exists.png)
[IEEE 2015 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2015.10.11-2015.10.15)] 2015 IEEE International Integrated Reliability Workshop (IIRW) - Aging model challenges in deeply scaled tri-gate technologies
Ramey, S., Lu, Y., Meric, I., Mudanai, S., Novak, S., Prasad, C., Hicks, J.Year:
2015
Language:
english
DOI:
10.1109/iirw.2015.7437067
File:
PDF, 1.59 MB
english, 2015