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[IEEE 2004 IEEE International Symposium on Circuits and Systems - Vancouver, BC, Canada (23-26 May 2004)] 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512) - An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli
Le Jin,, Chengming He,, Degang Chen,, Geiger, R.Year:
2004
Language:
english
DOI:
10.1109/iscas.2004.1328348
File:
PDF, 497 KB
english, 2004