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Ion beam induced mixing of the Cu/Si system using electrical resistivity and RBS measurements
A. J. Abu El-Haija, K. A. Al-Saleh, N. A. Halim, J. M. Khalifeh, N. S. SalehVolume:
107
Year:
1988
Language:
english
Pages:
8
DOI:
10.1002/pssa.2211070126
File:
PDF, 441 KB
english, 1988