Characterization of InxGa1−xAs/GaAs strained layer...

physica status solidi (a) 1988 Vol. 107; Iss. 1

Characterization of InxGa1−xAs/GaAs strained layer superlattices by ion backscattering-channeling and X-ray diffraction

R. Flagmeyer, K. Lenkeit, T. Baumbach, Yu. O. Kanter, A. A. Fedorov
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Volume:
107
Year:
1988
Language:
english
Pages:
1
DOI:
10.1002/pssa.2211070151
File:
PDF, 272 KB
english, 1988
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