Interference thickness oscillations of an X-ray wave on...

physica status solidi (a) 1988 Vol. 108; Iss. 2

Interference thickness oscillations of an X-ray wave on periodically profiled silicon

V. V. Aristov, U. Winter, A. Yu. Nikulin, S. V. Redkin, A. A. Snigirev, P. Zaumseil, V. A. Yunkin
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Volume:
108
Year:
1988
Language:
english
Pages:
5
DOI:
10.1002/pssa.2211080222
File:
PDF, 296 KB
english, 1988
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