A reinvestigation of Ni2Si thin film growth on Si(111) by...

A reinvestigation of Ni2Si thin film growth on Si(111) by TEM and RBS. Evidence of the presence of an interfacial NiSi layer prior to Ni consumption

R. Mattheis, D. Hesse
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Volume:
109
Year:
1988
Language:
english
Pages:
13
DOI:
10.1002/pssa.2211090123
File:
PDF, 1021 KB
english, 1988
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