![](/img/cover-not-exists.png)
A reinvestigation of Ni2Si thin film growth on Si(111) by TEM and RBS. Evidence of the presence of an interfacial NiSi layer prior to Ni consumption
R. Mattheis, D. HesseVolume:
109
Year:
1988
Language:
english
Pages:
13
DOI:
10.1002/pssa.2211090123
File:
PDF, 1021 KB
english, 1988