![](/img/cover-not-exists.png)
Structural analysis of silicon doped with high doses of C+ ions
I. A. Bachilo, F. F. Komarov, A. P. Novikov, S. A. PetrovVolume:
109
Year:
1988
Language:
english
Pages:
8
DOI:
10.1002/pssa.2211090124
File:
PDF, 522 KB
english, 1988