Detection of the active layer of AIIIBV semiconductor quantum-well structures by high resolution X-ray diffractometry
G. T. Baumbach, H. Rhan, U. PietschVolume:
109
Year:
1988
Language:
english
Pages:
1
DOI:
10.1002/pssa.2211090142
File:
PDF, 194 KB
english, 1988