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Effect of thickness and length of the sample on the dielectric constant ϵ′ and loss ϵ″ measurements in the microwave cavity perturbation technique
V. R. K. Murthy, R. RamanVolume:
109
Year:
1988
Language:
english
Pages:
1
DOI:
10.1002/pssa.2211090158
File:
PDF, 150 KB
english, 1988