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[IEEE 2006 International Semiconductor Conference - Sinaia, Romania (2006.09.27-2006.09.29)] 2006 International Semiconductor Conference - Development of Technology for Silicon Test Device for Genetic Analyses
Simion, Monica, Kleps, Irina, Craciunoiu, Florea, Savu, Lorand, Miu, Mihaela, Bragaru, AdinaYear:
2006
Language:
english
DOI:
10.1109/smicnd.2006.283971
File:
PDF, 4.26 MB
english, 2006