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[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - On the generation of test programs for chip multi-thread computer architectures
Ravotto, D., Sanchez, E., Reorda, M.S., Squillero, G.Year:
2008
Language:
english
DOI:
10.1109/test.2008.4700678
File:
PDF, 75 KB
english, 2008