[IEEE 2008 IEEE International Test Conference - Santa...

  • Main
  • [IEEE 2008 IEEE International Test...

[IEEE 2008 IEEE International Test Conference - Santa Clara, CA (2008.10.28-2008.10.30)] 2008 IEEE International Test Conference - On the generation of test programs for chip multi-thread computer architectures

Ravotto, D., Sanchez, E., Reorda, M.S., Squillero, G.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2008
Language:
english
DOI:
10.1109/test.2008.4700678
File:
PDF, 75 KB
english, 2008
Conversion to is in progress
Conversion to is failed