Investigation of Cu2O thin films using thermal interferometry
M. E. Abu-Zeid, Y. A. Youssef, A. E. Rakhshani, J. VargheseVolume:
113
Year:
1989
Language:
english
Pages:
7
DOI:
10.1002/pssa.2211130114
File:
PDF, 439 KB
english, 1989