Three Dimensional Stress Mapping of Silicon Surrounded by...

Three Dimensional Stress Mapping of Silicon Surrounded by Copper Filled through Silicon Vias Using Polychromator-Based Multi-Wavelength Micro Raman Spectroscopy

Trigg, Alastair David, Yu, Li Hong, Cheng, Cheng Kuo, Kumar, Rakesh, Kwong, Dim Lee, Ueda, Takeshi, Ishigaki, Toshikazu, Kang, Kitaek, Yoo, Woo Sik
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Volume:
3
Language:
english
Journal:
Applied Physics Express
DOI:
10.1143/APEX.3.086601
Date:
July, 2010
File:
PDF, 2.19 MB
english, 2010
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