Model Order Selection for Short Data: An Exponential...

EURASIP Journal on Advances in Signal Processing (Hindawi Publishing Corporation) 2007 Vol. 2007; Iss. 1

Model Order Selection for Short Data: An Exponential Fitting Test (EFT)

Quinlan, Angela, Barbot, Jean-Pierre, Larzabal, Pascal, Haardt, Martin
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Volume:
2007
Year:
2007
Language:
english
Journal:
EURASIP Journal on Advances in Signal Processing
DOI:
10.1155/2007/71953
File:
PDF, 856 KB
english, 2007
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