![](/img/cover-not-exists.png)
Hardness Variation with Indenter Sharpness in an Au Thin-Film
Lee, Yun-Hee, Kim, Yong-Il, Hahn, Jun-HeeVolume:
12
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2012.6334
Date:
July, 2012
File:
PDF, 6.29 MB
english, 2012