Numerical and Experimental Assessment of Charge Control in...

Journal of Nanoscience and Nanotechnology 2013 / 02 Vol. 13; Iss. 2

Numerical and Experimental Assessment of Charge Control in III–V Nano-Metal-Oxide-Semiconductor Field-Effect Transistor

Shi, Ming, Saint-Martin, Jérôme, Bournel, Arnaud, Querlioz, Damien, Dollfus, Philippe, Mo, Jiongjong, Wichmann, Nicolas, Desplanque, Ludovic, Wallart, Xavier, Danneville, Francois, Bollaert, Sylvain
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Volume:
13
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2013.6115
Date:
February, 2013
File:
PDF, 356 KB
english, 2013
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