Possible Origin of Dielectric Loss Behaviour in Samples of...

Possible Origin of Dielectric Loss Behaviour in Samples of TGS-Type Crystals

V. Lhotská, J. Fousek, N. Neumann
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Volume:
120
Year:
1990
Language:
english
Pages:
11
DOI:
10.1002/pssa.2211200125
File:
PDF, 546 KB
english, 1990
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