Charge Trap Spectroscopy in Single and Multiple Layer...

physica status solidi (a) 1990 Vol. 122; Iss. 1

Charge Trap Spectroscopy in Single and Multiple Layer Dielectrics

H.-J. Fitting, P. Magdanz, W. Mehnert, D. Hecht, Th. Hingst
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Volume:
122
Year:
1990
Language:
english
Pages:
13
DOI:
10.1002/pssa.2211220128
File:
PDF, 604 KB
english, 1990
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