X-Ray Diffraction Investigations of Structural Distortions...

X-Ray Diffraction Investigations of Structural Distortions of Ion-Implanted Semiconductor Single Crystals

A. G. Sedrakyan, V. S. Haroutyunyan, P. H. Bezirganyan, M. Subotowicz, K. G. Trouni
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Volume:
123
Year:
1991
Language:
english
Pages:
17
DOI:
10.1002/pssa.2211230107
File:
PDF, 728 KB
english, 1991
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