![](/img/cover-not-exists.png)
RBS and Ellipsometric Investigation of Amorphous GaAs Layers
E. Wendler, M. Kulik, W. Wesch, T. BachmannVolume:
126
Year:
1991
Language:
english
Pages:
1
DOI:
10.1002/pssa.2211260230
File:
PDF, 179 KB
english, 1991