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Characterization of the Interface i CdxHg1−xTe/CdTe Epilayers by IR Reflectivity and Electroreflectance
J. Kavaliauskas, G. Krivaite, D. Senuliene, A. SileikaVolume:
126
Year:
1991
Language:
english
Pages:
1
DOI:
10.1002/pssa.2211260250
File:
PDF, 190 KB
english, 1991