![](/img/cover-not-exists.png)
The effect of grown-in structural imperfections on the radiation defect formation and annealing in dislocation-free silicon
I. I. Kolkovskii, P. F. Lugakov, V. V. ShushaVolume:
127
Year:
1991
Language:
english
Pages:
7
DOI:
10.1002/pssa.2211270110
File:
PDF, 472 KB
english, 1991