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Resonance acoustic method of high-precision X-ray structure factor determination in perfect and slightly imperfect silicon
I. R. Entin, V. I. Khrupa, O. V. PetrosyanVolume:
127
Year:
1991
Language:
english
Pages:
6
DOI:
10.1002/pssa.2211270204
File:
PDF, 310 KB
english, 1991