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Impact of Scaling Down on Low Frequency Noise in Silicon...

Impact of Scaling Down on Low Frequency Noise in Silicon MOS Transistors

G. Ghibaudo, O. Roux-dit-Buisson, J. Brini
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Volume:
132
Year:
1992
Language:
english
Pages:
7
DOI:
10.1002/pssa.2211320226
File:
PDF, 350 KB
english, 1992
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