Electron microscopy and mass-spectrometry study of...

Electron microscopy and mass-spectrometry study of InGaAsP/InP heterostructures (pin diodes) grown by liquid phase epitaxy

V. V. Volkov, W. Luyten, J. Van Landuyt, C. Férauge, K. G. Oksenoid, R. Gijbels, M. G. Vasilev, A. A. Shelyakin, V. B. Lazarev
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Volume:
140
Year:
1993
Language:
english
Pages:
13
DOI:
10.1002/pssa.2211400105
File:
PDF, 2.09 MB
english, 1993
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