Irradiation-induced defects in thin aluminium films studied...

Irradiation-induced defects in thin aluminium films studied by 1/f noise

J. Briggmann, K. Dagge, W. Frank, A. Seeger, H. Stoll, A. H. Verbruggen
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Volume:
146
Year:
1994
Language:
english
Pages:
11
DOI:
10.1002/pssa.2211460128
File:
PDF, 676 KB
english, 1994
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