High resolution electron microscopy of semiconductor...

High resolution electron microscopy of semiconductor interfaces

A. K. Gutakovskii, L. I. Fedina, A. L. Aseev
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Volume:
150
Year:
1995
Language:
english
Pages:
14
DOI:
10.1002/pssa.2211500111
File:
PDF, 1.20 MB
english, 1995
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