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The Role of Metallic Impurities in the Field-Enhanced Carrier Generation in MOS Structures
P. Peykov, T. Diaz, H. Juárez, R. CastanedoVolume:
154
Year:
1996
Language:
english
Pages:
7
DOI:
10.1002/pssa.2211540213
File:
PDF, 359 KB
english, 1996