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Lumen degradation modeling of white-light LEDs in step stress accelerated degradation test
Huang, Jianlin, Golubović, Dušan S, Koh, Sau, Yang, Daoguo, Li, Xiupeng, Fan, Xuejun, Zhang, G.Q.Language:
english
Journal:
Reliability Engineering & System Safety
DOI:
10.1016/j.ress.2016.06.002
Date:
June, 2016
File:
PDF, 855 KB
english, 2016