[IEEE 2016 IEEE 34th VLSI Test Symposium (VTS) - Las Vegas, NV, USA (2016.4.25-2016.4.27)] 2016 IEEE 34th VLSI Test Symposium (VTS) - Security primitives (PUF and TRNG) with STT-MRAM
Vatajelu, Elena Ioana, Di Natale, Giorgio, Prinetto, PaoloYear:
2016
Language:
english
DOI:
10.1109/VTS.2016.7477292
File:
PDF, 318 KB
english, 2016