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SPIE Proceedings [SPIE Seventh International Symposium on Instrumentation and Control Technology - Beijing, China (Friday 10 October 2008)] Seventh International Symposium on Instrumentation and Control Technology: Sensors and Instruments, Computer Simulation, and Artificial Intelligence - A survey of modeling methods for analog circuit testability analysis
Chen, Xiaomei, Fang, Jiancheng, Wang, Zhongyu, Meng, Xiaofeng, Zhong, Bo, Ji, HongVolume:
7127
Year:
2008
Language:
english
DOI:
10.1117/12.806750
File:
PDF, 291 KB
english, 2008