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Reliability Evaluation of Nano-Bi/Silver Paste Sensor Electrode for Detecting Trace Metals
Lee, Gyoung-Ja, Kim, Chang Kyu, Lee, Min Ku, Rhee, Chang KyuVolume:
12
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2012.6356
Date:
July, 2012
File:
PDF, 2.32 MB
english, 2012