![](/img/cover-not-exists.png)
Analysis of Resistance and Surface Recombination Velocities by Contact Coverage for Optimizing Electrical Loss in c-Si Local Back Contact
Park, Cheolmin, Ryu, Kyungyul, Balaji, Nagarajan, Lee, Seunghwan, Kim, Jungmo, Ju, Minkyu, Lee, Youn-Jung, Lee, Hoongjoo, Yi, JunsinVolume:
15
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2015.9793
Date:
June, 2015
File:
PDF, 605 KB
english, 2015