Raman study of semiconductor clathrates under high pressure

Raman study of semiconductor clathrates under high pressure

T. Kume, T. Fukushima, S. Sasaki, H. Shimizu, H. Fukuoka, S. Yamanaka
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Volume:
244
Year:
2007
Language:
english
Pages:
5
DOI:
10.1002/pssb.200672517
File:
PDF, 372 KB
english, 2007
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