Optical analysis of dislocation-related physical processes...

Optical analysis of dislocation-related physical processes in GaN-based epilayers

De-Sheng Jiang, De-Gang Zhao, Hui Yang
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Volume:
244
Year:
2007
Language:
english
Pages:
14
DOI:
10.1002/pssb.200675604
File:
PDF, 682 KB
english, 2007
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