![](/img/cover-not-exists.png)
Optical analysis of dislocation-related physical processes in GaN-based epilayers
De-Sheng Jiang, De-Gang Zhao, Hui YangVolume:
244
Year:
2007
Language:
english
Pages:
14
DOI:
10.1002/pssb.200675604
File:
PDF, 682 KB
english, 2007