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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Time and Frequency Metrology III - Recent progress of time and frequency research in NIM
Lin, Yige, Ido, Tetsuya, Schibli, Thomas R., Fang, Zhanjun, Li, TianchuVolume:
8132
Year:
2011
Language:
english
DOI:
10.1117/12.892944
File:
PDF, 1.12 MB
english, 2011