Spectroscopic ellipsometry and electrical characterizations...

The European Physical Journal Plus 2016 / 6 Vol. 131; Iss. 6

Spectroscopic ellipsometry and electrical characterizations of InGaAs:Mg thin films lattice matched to InP

Zeydi, I., Ezzedini, M., Sayari, A., Shalaan, E., Wageh, S., Sfaxi, L., Al-Ghamdi, A. A., M’Gaieth, R.
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Volume:
131
Language:
english
Journal:
The European Physical Journal Plus
DOI:
10.1140/epjp/i2016-16189-0
Date:
June, 2016
File:
PDF, 1.42 MB
english, 2016
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