Probing Deformation Substructure by Synchrotron X-ray...

Probing Deformation Substructure by Synchrotron X-ray Diffraction and Dislocation Dynamics Modelling

Korsunsky, Alexander M., Hofmann, Felix, Song, Xu, Eve, Sophie, Collins, Steve P.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
10
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2010.2558
Date:
September, 2010
File:
PDF, 6.35 MB
english, 2010
Conversion to is in progress
Conversion to is failed