Thermal Endurance and Microstructural Evolution of PtGe for High-Performance Nano-Scale Ge-on-Si MOSFETs
Kang, Min-Ho, Shin, Hong-Sik, Oh, Se-Kyung, Yoo, Jung-Ho, Lee, Ga-Won, Oh, Jung-Woo, Majhi, Prashant, Jammy, Raj, Lee, Hi-DeokVolume:
11
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2011.4327
Date:
July, 2011
File:
PDF, 4.22 MB
english, 2011