Layer thickness dependent carrier recombination rate in HVPE GaN
Kęstutis Jarašiūnas, Tadas Malinauskas, Saulius Nargelas, Vytautas Gudelis, Juozas V. Vaitkus, Vitali Soukhoveev, Alexander UsikovVolume:
247
Year:
2010
Language:
english
Pages:
4
DOI:
10.1002/pssb.200983532
File:
PDF, 299 KB
english, 2010