Raman scattering characterization of p-type AlGaN layers

Raman scattering characterization of p-type AlGaN layers

Jung Gon Kim, Hiroaki Yamamoto, Yasuhito Kamei, Noriyuki Hasuike, Hiroshi Harima, Kenji Kisoda, Masaya Ishida, Katsuki Furukawa, Mototaka Taneya
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Volume:
247
Year:
2010
Language:
english
Pages:
3
DOI:
10.1002/pssb.200983568
File:
PDF, 295 KB
english, 2010
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