Acceptor behavior of N2O in MOCVD-grown ZnO thin-film transistors
Ogweon Seo, Haemi Kim, Junho Yun, Jungyol JoVolume:
247
Year:
2010
Language:
english
Pages:
4
DOI:
10.1002/pssb.200983683
File:
PDF, 358 KB
english, 2010