Boron induced charge traps near the interface of Si/SiO2...

Boron induced charge traps near the interface of Si/SiO2 probed by second harmonic generation

Heungman Park, Jingbo Qi, Ying Xu, Kalman Varga, Sharon M. Weiss, Bridget R. Rogers, Gunter Lüpke, Norman Tolk
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
247
Year:
2010
Language:
english
Pages:
5
DOI:
10.1002/pssb.200983956
File:
PDF, 564 KB
english, 2010
Conversion to is in progress
Conversion to is failed