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Boron induced charge traps near the interface of Si/SiO2 probed by second harmonic generation
Heungman Park, Jingbo Qi, Ying Xu, Kalman Varga, Sharon M. Weiss, Bridget R. Rogers, Gunter Lüpke, Norman TolkVolume:
247
Year:
2010
Language:
english
Pages:
5
DOI:
10.1002/pssb.200983956
File:
PDF, 564 KB
english, 2010